Kapur, Rohit.
CTL for test information of digital ICs [electronic resource] / by Rohit Kapur. - Boston : Kluwer Academic Publishers, 2003. - ix, 173 p. : ill.
Electronic reproduction.
Palo Alto, Calif. :
ebrary,
2013.
Available via World Wide Web.
Access may be limited to ebrary affiliated libraries.
Digital integrated circuits--Testing--Standards.
Computer hardware description languages.
Electronic books.
TK7874.65 / .K35 2003eb
621.3815/48
CTL for test information of digital ICs [electronic resource] / by Rohit Kapur. - Boston : Kluwer Academic Publishers, 2003. - ix, 173 p. : ill.
Electronic reproduction.
Palo Alto, Calif. :
ebrary,
2013.
Available via World Wide Web.
Access may be limited to ebrary affiliated libraries.
Digital integrated circuits--Testing--Standards.
Computer hardware description languages.
Electronic books.
TK7874.65 / .K35 2003eb
621.3815/48