Montrose, Mark I.
Testing for EMC compliance approaches and techniques / [electronic resource] : Mark I. Montrose, Edward M. Nakauchi. - Hoboken, NJ : John Wiley, 2004. - xviii, 460 p. : ill.
Includes bibliographical references (p. 447-451) and index.
Electronic reproduction.
Palo Alto, Calif. :
ebrary,
2013.
Available via World Wide Web.
Access may be limited to ebrary affiliated libraries.
Electromagnetic compatibility.
Electromagnetic interference.
Electronic books.
TK7867.2 / M66 2004eb
621.382/24
Testing for EMC compliance approaches and techniques / [electronic resource] : Mark I. Montrose, Edward M. Nakauchi. - Hoboken, NJ : John Wiley, 2004. - xviii, 460 p. : ill.
Includes bibliographical references (p. 447-451) and index.
Electronic reproduction.
Palo Alto, Calif. :
ebrary,
2013.
Available via World Wide Web.
Access may be limited to ebrary affiliated libraries.
Electromagnetic compatibility.
Electromagnetic interference.
Electronic books.
TK7867.2 / M66 2004eb
621.382/24