Haugstad, Greg, 1963-
Atomic force microscopy exploring basic modes and advanced applications / [electronic resource] : Greg Haugstad. - Hoboken, N.J. : John Wiley & Sons, c2012. - xxii, 464 p. : ill.
Includes bibliographical references and index.
Electronic reproduction.
Palo Alto, Calif. :
ebrary,
2011.
Available via World Wide Web.
Access may be limited to ebrary affiliated libraries.
Atomic force microscopy.
Scanning proble microscopy.
Electronic books.
QH212.A78 / H38 2012eb
620/.5
Atomic force microscopy exploring basic modes and advanced applications / [electronic resource] : Greg Haugstad. - Hoboken, N.J. : John Wiley & Sons, c2012. - xxii, 464 p. : ill.
Includes bibliographical references and index.
Electronic reproduction.
Palo Alto, Calif. :
ebrary,
2011.
Available via World Wide Web.
Access may be limited to ebrary affiliated libraries.
Atomic force microscopy.
Scanning proble microscopy.
Electronic books.
QH212.A78 / H38 2012eb
620/.5