Voldman, Steven H.
ESD failure mechanisms and models / [electronic resource] : Electrostatic discharge Steven H. Voldman. - Chichester, West Sussex, U.K. ; Hoboken, NJ : J. Wiley, 2009. - xxiv, 384 p.
Includes bibliographical references and index.
Electronic reproduction.
Palo Alto, Calif. :
ebrary,
2009.
Available via World Wide Web.
Access may be limited to ebrary affiliated libraries.
Semiconductors--Failures.
Integrated circuits--Protection.
Integrated circuits--Testing.
Integrated circuits--Reliability.
Electric discharges.
Electrostatics.
Electronic books.
TK7871.852 / .V65 2009eb
621.381
ESD failure mechanisms and models / [electronic resource] : Electrostatic discharge Steven H. Voldman. - Chichester, West Sussex, U.K. ; Hoboken, NJ : J. Wiley, 2009. - xxiv, 384 p.
Includes bibliographical references and index.
Electronic reproduction.
Palo Alto, Calif. :
ebrary,
2009.
Available via World Wide Web.
Access may be limited to ebrary affiliated libraries.
Semiconductors--Failures.
Integrated circuits--Protection.
Integrated circuits--Testing.
Integrated circuits--Reliability.
Electric discharges.
Electrostatics.
Electronic books.
TK7871.852 / .V65 2009eb
621.381