Electron microscopy and analysis [electronic resource] / Peter J. Goodhew, John Humphreys, Richard Beanland.
By: Goodhew, Peter J.
Contributor(s): Beanland, R | Humphreys, F. J | ebrary, Inc.
Material type: BookPublisher: London : Taylor & Francis, 2001Edition: 3rd ed.Description: xi, 251 p. : ill.Subject(s): Electron microscopyGenre/Form: Electronic books.DDC classification: 502.825 Online resources: An electronic book accessible through the World Wide Web; click to viewItem type | Current location | Collection | Call number | URL | Copy number | Status | Date due | Item holds |
---|---|---|---|---|---|---|---|---|
E-book | IUKL Library | Subscripti | http://site.ebrary.com/lib/kliuc/Doc?id=10017829 | 1 | Available |
Total holds: 0
Previous ed.: 1988.
Includes bibliographical references and index.
Electronic reproduction. Palo Alto, Calif. : ebrary, 2013. Available via World Wide Web. Access may be limited to ebrary affiliated libraries.
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