Atomic force microscopy [electronic resource] : exploring basic modes and advanced applications / Greg Haugstad.
By: Haugstad, Greg.
Contributor(s): ebrary, Inc.
Material type:
BookPublisher: Hoboken, N.J. : John Wiley & Sons, c2012Description: xxii, 464 p. : ill.Subject(s): Atomic force microscopy | Scanning proble microscopyGenre/Form: Electronic books.DDC classification: 620/.5 Online resources: An electronic book accessible through the World Wide Web; click to view
| Item type | Current location | Collection | Call number | URL | Copy number | Status | Date due | Item holds |
|---|---|---|---|---|---|---|---|---|
E-book
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IUKL Library | Subscripti | http://site.ebrary.com/lib/kliuc/Doc?id=10606048 | 1 | Available |
Total holds: 0
Includes bibliographical references and index.
Electronic reproduction. Palo Alto, Calif. : ebrary, 2011. Available via World Wide Web. Access may be limited to ebrary affiliated libraries.
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