Fringe pattern analysis for optical metrology : theory, algorithms, and applications / Manuel Servin, J. Antonio Quiroga, and J. Moises Padilla.
By: Serv�in, Manuel [author.].
Contributor(s): Quiroga, J. Antonio [author.] | Padilla, J. Moises [author.].
Material type:
BookPublisher: Weinheim, Germany : Wiley-VCH Verlag GmbH & Co. KGaA, 2014Copyright date: �2014Description: 1 online resource (345 pages) : illustrations.Content type: text Media type: computer Carrier type: online resourceISBN: 9783527681082 (e-book).Subject(s): Diffraction patterns -- Data processing | Image processing -- Data processingGenre/Form: Electronic books.DDC classification: 621.36 Online resources: An electronic book accessible through the World Wide Web; click to view
| Item type | Current location | Collection | Call number | URL | Copy number | Status | Date due | Item holds |
|---|---|---|---|---|---|---|---|---|
E-book
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IUKL Library | Subscripti | http://site.ebrary.com/lib/kliuc/Doc?id=10881255 | 1 | Available |
Total holds: 0
Includes bibliographical references and index.
Description based on online resource; title from PDF title page (ebrary, viewed June 19, 2014).
Electronic reproduction. Palo Alto, Calif. : ebrary, 2015. Available via World Wide Web. Access may be limited to ebrary affiliated libraries.
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