Conductive atomic force microscopy : applications in nanomaterials / edited by Mario Lanza.
Contributor(s): Lanza, Mario [editor.].
Material type:
BookPublisher: Weinheim, Germany : Wiley-VCH, 2017Copyright date: �2017Description: 1 online resource (99 pages).Content type: text Media type: computer Carrier type: online resourceISBN: 9783527699797 (e-book).Subject(s): Atomic force microscopyGenre/Form: Electronic books.DDC classification: 502.82 Online resources: Click to View
| Item type | Current location | Collection | Call number | URL | Copy number | Status | Date due | Item holds |
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E-book
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IUKL Library | Subscripti | https://ebookcentral.proquest.com/lib/kliuc-ebooks/detail.action?docID=4939442 | 1 | Available |
Includes bibliographical references at the end of each chapters and index.
Description based on online resource; title from PDF title page (ebrary, viewed August 30, 2017).
Electronic reproduction. Ann Arbor, MI : ProQuest, 2016. Available via World Wide Web. Access may be limited to ProQuest affiliated libraries.
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