Radiation effects and soft errors in integrated circuits and electronic devices [electronic resource] / editors, R.D. Schrimpf, D.M. Fleetwood.
Contributor(s): Schrimpf, Ronald Donald | Fleetwood, D. M. (Dan M.) | ebrary, Inc.
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Also published in the International Journal of High Speed Electronics and Systems, v. 14, no. 2 (2004) p. 285-623.
Includes bibliographical references.
Electronic reproduction. Palo Alto, Calif. : ebrary, 2011. Available via World Wide Web. Access may be limited to ebrary affiliated libraries.
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