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ISTFA 2006 [electronic resource] : proceedings of the 32nd International Symposium for Testing and Failure Analysis, November 12-16, 2006, Renaissance Austin Hotel, Austin, Texas, USA.

By: (23rd : International Symposium for Testing and Failure Analysis (23rd : 2006 : Austin, Tex.).
Contributor(s): ASM International | ebrary, Inc.
Material type: materialTypeLabelBookPublisher: Materials Park, OH : ASM International, 2006Description: xx, 524 p. : ill.Other title: Proceedings of the 32nd International Symposium for Testing and Failure Analysis | Conference proceedings from the 32nd International Symposium for Testing and Failure Analysis.Subject(s): Electronics -- Materials -- Testing -- Congresses | Electronic apparatus and appliances -- Testing -- Congresses | Materials -- Testing -- CongressesGenre/Form: Electronic books.Online resources: An electronic book accessible through the World Wide Web; click to view
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Includes bibliographical references and index.

Electronic reproduction. Palo Alto, Calif. : ebrary, 2009. Available via World Wide Web. Access may be limited to ebrary affiliated libraries.

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