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Advanced production testing of RF, SoC, and SiP devices [electronic resource] / Joe Kelly, Michael Engelhardt.

By: Kelly, Joe.
Contributor(s): Engelhardt, M. (Michael) | ebrary, Inc.
Material type: materialTypeLabelBookSeries: Artech House microwave library: Publisher: Boston : Artech House, 2007Description: xx, 301 p. : ill.Subject(s): Systems on a chip -- Testing | Embedded computer systemsGenre/Form: Electronic books.Online resources: An electronic book accessible through the World Wide Web; click to view
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Includes bibliographical references and index.

Electronic reproduction. Palo Alto, Calif. : ebrary, 2009. Available via World Wide Web. Access may be limited to ebrary affiliated libraries.

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