ISTFA 2007 [electronic resource] : proceedings of the 33rd International Symposium for Testing and Failure Analysis, November 4-8, 2007, San Jose McEnery Convention Center, San Jose, California, USA / sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2007, ASM International.
By: (33rd : International Symposium for Testing and Failure Analysis (33rd : 2007 : San Jose, Calif.).
Contributor(s): ASM International | Electronic Device Failure Analysis Society | ebrary, Inc.
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Includes bibliographical references and index.
Electronic reproduction. Palo Alto, Calif. : ebrary, 2009. Available via World Wide Web. Access may be limited to ebrary affiliated libraries.
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