ISTFA 2000 [electronic resource] : proceedings of the 26th International Symposium for Testing and Failure Analysis, 12-16 November 2000, Meydenbauer Convention Center, Bellevue, Washington.
By: (26th : International Symposium for Testing and Failure Analysis (26th : 2000 : Bellevue, Wash.).
Contributor(s): ASM International | Electronic Device Failure Analysis Society | ebrary, Inc.
Material type:
BookPublisher: Materials Park, OH : ASM International, c2000Description: xvi, 577 p. : ill.Other title: Proceedings of the 26th International Symposium or Testing and Failure Analysis | Conference Proceedings from the 26th International Symposium for Testing and Failure Analysis.Subject(s): Electronics -- Materials -- Testing -- Congresses | Electronic apparatus and appliances -- Testing -- CongressesGenre/Form: Electronic books.Online resources: An electronic book accessible through the World Wide Web; click to view
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"Sponsored by EDFAS, ISTFA".
Includes bibliographical references and index.
Electronic reproduction. Palo Alto, Calif. : ebrary, 2009. Available via World Wide Web. Access may be limited to ebrary affiliated libraries.
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