ISTFA 2001 [electronic resource] : proceedings of the 27th International Symposium for Testing and Failure Analysis : 11-15 November 2001, Santa Clara Convention Center, Santa Clara, California / sponsored by EDFAS.
By: (27th : International Symposium for Testing and Failure Analysis (27th : 2001 : Santa Clara, Calif.).
Contributor(s): ASM International | Electronic Device Failure Analysis Society | ebrary, Inc.
Material type:
BookPublisher: Materials Park, OH : ASM International, c2001Description: xix, 485 p. : ill.Other title: Proceedings of the 27th International Symposium or Testing and Failure Analysis | Conference Proceedings from the 27th International Symposium for Testing and Failure Analysis.Subject(s): Electronics -- Materials -- Testing -- Congresses | Electronic apparatus and appliances -- Testing -- CongressesGenre/Form: Electronic books.Online resources: An electronic book accessible through the World Wide Web; click to view
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Sponsored by EDFAS, ISTFA.
Includes bibliographical references and index.
Electronic reproduction. Palo Alto, Calif. : ebrary, 2009. Available via World Wide Web. Access may be limited to ebrary affiliated libraries.
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