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		No cover image available Polymers for electronic components [electronic resource] : a Rapra industry analysis report / by Keith Cousins. by Cousins, Keith \| Rapra Technology Limited \| ebrary, Inc. Material type: Book; Format: electronic available online ; Literary form: Not fiction Publisher: Shrewsbury, U.K. : Rapra Technology, 2001Online access: An electronic book accessible through the World Wide Web; click to view Availability: Items available for loan: IUKL Library (1). Place hold Log in to add tags. Add to cart (remove)
		ISTFA 2014 : conference proceedings from the 40th International Symposium for Testing and Failure Analysis ; November 9-13, 2014, George R. Brown Conversion Center, Houston, Texas, USA / organized by Electronic Device Failure Analysis Society, ASM International. by International Symposium for Testing and Failure Analysis (40th : 2014 : Houston, Tex.) \| Electronic Device Failure Analysis Society [organizer.] \| ASM International [organizer.]. Material type: Book; Format: available online ; Literary form: Not fiction Publisher: Materials Park, Ohio : ASM International, 2014Copyright date: �2014Online access: An electronic book accessible through the World Wide Web; click to view Availability: Items available for loan: IUKL Library (1). Place hold Add to cart (remove)
		No cover image available Electrical characterization of organic electronic materials and devices [electronic resource] / Peter Stallinga. by Stallinga, Peter, 1966- \| ebrary, Inc. Material type: Book; Format: electronic available online ; Literary form: Not fiction Publisher: Hoboken, NJ : John Wiley & Sons, 2009Online access: An electronic book accessible through the World Wide Web; click to view Availability: Items available for loan: IUKL Library (1). Lists: 20220421 MQA FEST Bachelor of Electronics Engineering with Honours . Place hold Add to cart (remove)
		No cover image available ISTFA 2012 [electronic resource] : conference proceedings from the 38th International Symposium for Testing and Failure Analysis : November 11-15, 2012, Phoenix Convention Center, Phoenix, Arizona, USA. by ebrary, Inc. Material type: Book; Format: electronic available online ; Literary form: Not fiction Publisher: Materials Park, Ohio : ASM International, 2012Online access: An electronic book accessible through the World Wide Web; click to view Availability: Items available for loan: IUKL Library (1). Place hold Add to cart (remove)
		ISTFA 2013 : conference proceedings from the 39th International Symposium for Testing and Failure Analysis, November 3-7, 2013, San Jose Convention Center, San Jose, California, USA / sponsored by Electronic Device Failure Analysis Society. by Electronic Device Failure Analysis Society [sponsor.]. Material type: Book; Format: available online ; Literary form: Not fiction Publisher: Materials Park, Ohio : ASM International, 2013Copyright date: �2013Online access: An electronic book accessible through the World Wide Web; click to view Availability: Items available for loan: IUKL Library (1). Place hold Add to cart (remove)
		No cover image available ISTFA '99 [electronic resource] : proceedings of the 25th International Symposium for Testing and Failure Analysis : 14-18 November 1999, Westin Hotel, Santa Clara, California. by International Symposium for Testing and Failure Analysis (25th : 1999 : Santa Clara, Calif.) \| ASM International \| Electronic Device Failure Analysis Society \| ebrary, Inc. Material type: Book; Format: electronic available online ; Literary form: Not fiction Publisher: Materials Park, OH : ASM International, c1999Other title: Proceedings of the 25th International Symposium or Testing and Failure Analysis \| Conference Proceedings from the 25th International Symposium for Testing and Failure Analysis.Online access: An electronic book accessible through the World Wide Web; click to view Availability: Items available for loan: IUKL Library (1). Place hold Add to cart (remove)
		No cover image available ISTFA 2005 [electronic resource] : Proceedings of the 31st International Symposium for Testing and Failure Analysis, Movember 6-10, 2005, McEnery Convention Center, San Jose, California / sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2005, ASTM International. by International Symposium for Testing and Failure Analysis (31st : d2005 : San Jose, Calif.) \| ASM International \| Electronic Device Failure Analysis Society \| ebrary, Inc. Material type: Book; Format: electronic available online ; Literary form: Not fiction Publisher: Materials Park, OH : ASM International, c2005Online access: An electronic book accessible through the World Wide Web; click to view Availability: Items available for loan: IUKL Library (1). Place hold Add to cart (remove)
		No cover image available ISTFA '97 [electronic resource] : proceedings of the 23rd International Symposium for Testing and Failure Analysis : 27-31 October, 1997, Santa Clara Convention center, Santa Clara, California / sponsored by ASM International. by International Symposium for Testing and Failure Analysis (23rd : 1997 : Santa Clara, Calif.) \| Davidson, Grace M \| ASM International \| ebrary, Inc. Material type: Book; Format: electronic available online ; Literary form: Not fiction Publisher: Materials Park, OH : ASM International, c1997Other title: 23rd international symposium for testing and failure analysis.Online access: An electronic book accessible through the World Wide Web; click to view Availability: Items available for loan: IUKL Library (1). Place hold Add to cart (remove)
		No cover image available ISTFA '98 [electronic resource] : proceedings of the 24th International Symposium for Testing and Failure Analysis : 15-19 November 1998, Hyatt Regency DFW, Dallas, Texas / sponsored by ISFTA, ASM International. by International Symposium for Testing and Failure Analysis (24th : 1998 : Dallas, Tex.) \| ASM International \| ebrary, Inc. Material type: Book; Format: electronic available online ; Literary form: Not fiction Publisher: Materials Park, OH : ASM International, c1998Other title: Proceedings of the 24th International Symposium for Testing and Failure Analysis \| Conference proceedings from the 24th International Symposium for Testing and Failure Analysis.Online access: An electronic book accessible through the World Wide Web; click to view Availability: Items available for loan: IUKL Library (1). Place hold Add to cart (remove)
		No cover image available ISTFA '96 [electronic resource] : proceedings of the 22nd International Symposium for Testing and Failure Analysis : 18-22 November 1996, Los Angeles, California. by International Symposium for Testing and Failure Analysis (22nd : 1996 : Los Angeles, Calif.) \| ASM International. Electronic Materials and Processing Division \| ebrary, Inc. Material type: Book; Format: electronic available online ; Literary form: Not fiction Publisher: Materials Park, Ohio : ASM International, c1996Online access: An electronic book accessible through the World Wide Web; click to view Availability: Items available for loan: IUKL Library (1). Place hold Add to cart (remove)
		No cover image available ISTFA 2004 [electronic resource] : proceedings of the 30th International Symposium for Testing and Failure Analysis, November 14-18, 2004, Worcester's Centrum Centre, Worcester (Boston), Massachusetts / sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2004, ASTM International. by International Symposium for Testing and Failure Analysis (30th : 2004 : Boston, Mass.) \| ASM International \| Electronic Device Failure Analysis Society \| ebrary, Inc. Material type: Book; Format: electronic available online ; Literary form: Not fiction Publisher: Materials Park, OH : ASM International, c2004Online access: An electronic book accessible through the World Wide Web; click to view Availability: Items available for loan: IUKL Library (1). Place hold Add to cart (remove)
		No cover image available ISTFA 2006 [electronic resource] : proceedings of the 32nd International Symposium for Testing and Failure Analysis, November 12-16, 2006, Renaissance Austin Hotel, Austin, Texas, USA. by International Symposium for Testing and Failure Analysis (23rd : 2006 : Austin, Tex.) \| ASM International \| ebrary, Inc. Material type: Book; Format: electronic available online ; Literary form: Not fiction Publisher: Materials Park, OH : ASM International, 2006Other title: Proceedings of the 32nd International Symposium for Testing and Failure Analysis \| Conference proceedings from the 32nd International Symposium for Testing and Failure Analysis.Online access: An electronic book accessible through the World Wide Web; click to view Availability: Items available for loan: IUKL Library (1). Place hold Add to cart (remove)
		No cover image available ISTFA 2003 [electronic resource] : proceedings of the 29th International Symposium for Testing and Failure Analysis, 2-6 November 2003, Santa Clara Convention Center, Santa Clara, California / sponsored by EDFAS. by International Symposium for Testing and Failure Analysis (29th : 2003 : Santa Clara, Calif.) \| ASM International \| Electronic Device Failure Analysis Society \| ebrary, Inc. Material type: Book; Format: electronic available online ; Literary form: Not fiction Publisher: Materials Park, Ohio : ASM International, 2003Other title: Proceedings of the 29th International Symposium for Testing and Failure Analysis, 2-6 November 2003 \| Conference proceedings from the 29th International Symposium for Testing and Failure Analysis.Online access: An electronic book accessible through the World Wide Web; click to view Availability: Items available for loan: IUKL Library (1). Place hold Add to cart (remove)
		No cover image available Microwave component mechanics [electronic resource] / Harri Eskelinen, Pekka Eskelinen. by Eskelinen, Harri \| Eskelinen, Pekka \| ebrary, Inc. Material type: Book; Format: electronic available online ; Literary form: Not fiction Publisher: Boston, MA : Artech House, c2003Online access: An electronic book accessible through the World Wide Web; click to view Availability: Items available for loan: IUKL Library (1). Place hold Add to cart (remove)
		No cover image available Microelectronic failure analysis [electronic resource] : desk reference. 2002 supplement / prepared under the direction of the Electronic Device Failure Analysis Society publications committee. by Electronic Device Failure Analysis Society \| ebrary, Inc. Material type: Book; Format: electronic available online ; Literary form: Not fiction Publisher: Materials Park, OH : ASM International, c2002Online access: An electronic book accessible through the World Wide Web; click to view Availability: Items available for loan: IUKL Library (1). Lists: 20220421 MQA FEST Bachelor of Electronics Engineering with Honours . Place hold Add to cart (remove)
		No cover image available ISTFA 2008 [electronic resource] : conference proceedings from the 34th International Symposium for Testing and Failure Analysis, November 2-6, 2008, Oregon Convention Center, Portland, Oregon, USA / sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2008, ASM International. by International Symposium for Testing and Failure Analysis (34th : 2008 : Portland, Or.) \| ASM International \| Electronic Device Failure Analysis Society \| ebrary, Inc. Material type: Book; Format: electronic available online ; Literary form: Not fiction Publisher: Materials Park, OH : Asm International, c2008Other title: Proceedings of the 34th International Symposium for Testing and Failure Analysis \| 34th International Symposium for Testing and Failure Analysis \| Thirty-fourth International Symposium for Testing and Failure Analysis.Online access: An electronic book accessible through the World Wide Web; click to view Availability: Items available for loan: IUKL Library (1). Place hold Add to cart (remove)
		No cover image available ISTFA 2002 [electronic resource] : proceedings of the 28th International Symposium for Testing and Failure Analysis : 3-7 November 2002, Phoenix Civic Center, Phoenix, Ariz. / sponsored by EDFAS, ISTFA. by International Symposium for Testing and Failure Analysis (28th : 2002 : Phoenix, Ariz.) \| ASM International \| Electronic Device Failure Analysis Society \| ebrary, Inc. Material type: Book; Format: electronic available online ; Literary form: Not fiction Publisher: Materials Park, OH : ASM International, 2002Other title: Proceedings of the 28th International Symposium for Testing and Failure Analysis \| Conference proceedings from the 28th International Symposium for Testing and Failure Analysis.Online access: An electronic book accessible through the World Wide Web; click to view Availability: Items available for loan: IUKL Library (1). Place hold Add to cart (remove)
		No cover image available ISTFA 2007 [electronic resource] : proceedings of the 33rd International Symposium for Testing and Failure Analysis, November 4-8, 2007, San Jose McEnery Convention Center, San Jose, California, USA / sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2007, ASM International. by International Symposium for Testing and Failure Analysis (33rd : 2007 : San Jose, Calif.) \| ASM International \| Electronic Device Failure Analysis Society \| ebrary, Inc. Material type: Book; Format: electronic available online ; Literary form: Not fiction Publisher: Materials Park, OH : ASM International, c2007Other title: Proceedings of the 33rd International Symposium for Testing and Failure Analysis \| 33rd International Symposium for Testing and Failure Analysis \| Thirty-third International Symposium for Testing and Failure Analysis.Online access: An electronic book accessible through the World Wide Web; click to view Availability: Items available for loan: IUKL Library (1). Place hold Add to cart (remove)
		No cover image available ISTFA 2000 [electronic resource] : proceedings of the 26th International Symposium for Testing and Failure Analysis, 12-16 November 2000, Meydenbauer Convention Center, Bellevue, Washington. by International Symposium for Testing and Failure Analysis (26th : 2000 : Bellevue, Wash.) \| ASM International \| Electronic Device Failure Analysis Society \| ebrary, Inc. Material type: Book; Format: electronic available online ; Literary form: Not fiction Publisher: Materials Park, OH : ASM International, c2000Other title: Proceedings of the 26th International Symposium or Testing and Failure Analysis \| Conference Proceedings from the 26th International Symposium for Testing and Failure Analysis.Online access: An electronic book accessible through the World Wide Web; click to view Availability: Items available for loan: IUKL Library (1). Place hold Add to cart (remove)
		No cover image available Microelectronic failure analysis [electronic resource] : desk reference : 2001 supplement / prepared under the direction of the Electronic Device Failure Analysis Society Publications Committee. by Electronic Device Failure Analysis Society \| ebrary, Inc. Material type: Book; Format: electronic available online ; Literary form: Not fiction Publisher: Materials Park, OH : ASM International, c2001Online access: An electronic book accessible through the World Wide Web; click to view Availability: Items available for loan: IUKL Library (1). Lists: 20220421 MQA FEST Bachelor of Electronics Engineering with Honours . Place hold Add to cart (remove)

		No cover image available Polymers for electronic components [electronic resource] : a Rapra industry analysis report / by Keith Cousins. by Cousins, Keith \| Rapra Technology Limited \| ebrary, Inc. Material type: Book; Format: electronic available online ; Literary form: Not fiction Publisher: Shrewsbury, U.K. : Rapra Technology, 2001Online access: An electronic book accessible through the World Wide Web; click to view Availability: Items available for loan: IUKL Library (1). Place hold Log in to add tags. Add to cart (remove)
		ISTFA 2014 : conference proceedings from the 40th International Symposium for Testing and Failure Analysis ; November 9-13, 2014, George R. Brown Conversion Center, Houston, Texas, USA / organized by Electronic Device Failure Analysis Society, ASM International. by International Symposium for Testing and Failure Analysis (40th : 2014 : Houston, Tex.) \| Electronic Device Failure Analysis Society [organizer.] \| ASM International [organizer.]. Material type: Book; Format: available online ; Literary form: Not fiction Publisher: Materials Park, Ohio : ASM International, 2014Copyright date: �2014Online access: An electronic book accessible through the World Wide Web; click to view Availability: Items available for loan: IUKL Library (1). Place hold Add to cart (remove)
		No cover image available Electrical characterization of organic electronic materials and devices [electronic resource] / Peter Stallinga. by Stallinga, Peter, 1966- \| ebrary, Inc. Material type: Book; Format: electronic available online ; Literary form: Not fiction Publisher: Hoboken, NJ : John Wiley & Sons, 2009Online access: An electronic book accessible through the World Wide Web; click to view Availability: Items available for loan: IUKL Library (1). Lists: 20220421 MQA FEST Bachelor of Electronics Engineering with Honours . Place hold Add to cart (remove)
		No cover image available ISTFA 2012 [electronic resource] : conference proceedings from the 38th International Symposium for Testing and Failure Analysis : November 11-15, 2012, Phoenix Convention Center, Phoenix, Arizona, USA. by ebrary, Inc. Material type: Book; Format: electronic available online ; Literary form: Not fiction Publisher: Materials Park, Ohio : ASM International, 2012Online access: An electronic book accessible through the World Wide Web; click to view Availability: Items available for loan: IUKL Library (1). Place hold Add to cart (remove)
		ISTFA 2013 : conference proceedings from the 39th International Symposium for Testing and Failure Analysis, November 3-7, 2013, San Jose Convention Center, San Jose, California, USA / sponsored by Electronic Device Failure Analysis Society. by Electronic Device Failure Analysis Society [sponsor.]. Material type: Book; Format: available online ; Literary form: Not fiction Publisher: Materials Park, Ohio : ASM International, 2013Copyright date: �2013Online access: An electronic book accessible through the World Wide Web; click to view Availability: Items available for loan: IUKL Library (1). Place hold Add to cart (remove)
		No cover image available ISTFA '99 [electronic resource] : proceedings of the 25th International Symposium for Testing and Failure Analysis : 14-18 November 1999, Westin Hotel, Santa Clara, California. by International Symposium for Testing and Failure Analysis (25th : 1999 : Santa Clara, Calif.) \| ASM International \| Electronic Device Failure Analysis Society \| ebrary, Inc. Material type: Book; Format: electronic available online ; Literary form: Not fiction Publisher: Materials Park, OH : ASM International, c1999Other title: Proceedings of the 25th International Symposium or Testing and Failure Analysis \| Conference Proceedings from the 25th International Symposium for Testing and Failure Analysis.Online access: An electronic book accessible through the World Wide Web; click to view Availability: Items available for loan: IUKL Library (1). Place hold Add to cart (remove)
		No cover image available ISTFA 2005 [electronic resource] : Proceedings of the 31st International Symposium for Testing and Failure Analysis, Movember 6-10, 2005, McEnery Convention Center, San Jose, California / sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2005, ASTM International. by International Symposium for Testing and Failure Analysis (31st : d2005 : San Jose, Calif.) \| ASM International \| Electronic Device Failure Analysis Society \| ebrary, Inc. Material type: Book; Format: electronic available online ; Literary form: Not fiction Publisher: Materials Park, OH : ASM International, c2005Online access: An electronic book accessible through the World Wide Web; click to view Availability: Items available for loan: IUKL Library (1). Place hold Add to cart (remove)
		No cover image available ISTFA '97 [electronic resource] : proceedings of the 23rd International Symposium for Testing and Failure Analysis : 27-31 October, 1997, Santa Clara Convention center, Santa Clara, California / sponsored by ASM International. by International Symposium for Testing and Failure Analysis (23rd : 1997 : Santa Clara, Calif.) \| Davidson, Grace M \| ASM International \| ebrary, Inc. Material type: Book; Format: electronic available online ; Literary form: Not fiction Publisher: Materials Park, OH : ASM International, c1997Other title: 23rd international symposium for testing and failure analysis.Online access: An electronic book accessible through the World Wide Web; click to view Availability: Items available for loan: IUKL Library (1). Place hold Add to cart (remove)
		No cover image available ISTFA '98 [electronic resource] : proceedings of the 24th International Symposium for Testing and Failure Analysis : 15-19 November 1998, Hyatt Regency DFW, Dallas, Texas / sponsored by ISFTA, ASM International. by International Symposium for Testing and Failure Analysis (24th : 1998 : Dallas, Tex.) \| ASM International \| ebrary, Inc. Material type: Book; Format: electronic available online ; Literary form: Not fiction Publisher: Materials Park, OH : ASM International, c1998Other title: Proceedings of the 24th International Symposium for Testing and Failure Analysis \| Conference proceedings from the 24th International Symposium for Testing and Failure Analysis.Online access: An electronic book accessible through the World Wide Web; click to view Availability: Items available for loan: IUKL Library (1). Place hold Add to cart (remove)
		No cover image available ISTFA '96 [electronic resource] : proceedings of the 22nd International Symposium for Testing and Failure Analysis : 18-22 November 1996, Los Angeles, California. by International Symposium for Testing and Failure Analysis (22nd : 1996 : Los Angeles, Calif.) \| ASM International. Electronic Materials and Processing Division \| ebrary, Inc. Material type: Book; Format: electronic available online ; Literary form: Not fiction Publisher: Materials Park, Ohio : ASM International, c1996Online access: An electronic book accessible through the World Wide Web; click to view Availability: Items available for loan: IUKL Library (1). Place hold Add to cart (remove)
		No cover image available ISTFA 2004 [electronic resource] : proceedings of the 30th International Symposium for Testing and Failure Analysis, November 14-18, 2004, Worcester's Centrum Centre, Worcester (Boston), Massachusetts / sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2004, ASTM International. by International Symposium for Testing and Failure Analysis (30th : 2004 : Boston, Mass.) \| ASM International \| Electronic Device Failure Analysis Society \| ebrary, Inc. Material type: Book; Format: electronic available online ; Literary form: Not fiction Publisher: Materials Park, OH : ASM International, c2004Online access: An electronic book accessible through the World Wide Web; click to view Availability: Items available for loan: IUKL Library (1). Place hold Add to cart (remove)
		No cover image available ISTFA 2006 [electronic resource] : proceedings of the 32nd International Symposium for Testing and Failure Analysis, November 12-16, 2006, Renaissance Austin Hotel, Austin, Texas, USA. by International Symposium for Testing and Failure Analysis (23rd : 2006 : Austin, Tex.) \| ASM International \| ebrary, Inc. Material type: Book; Format: electronic available online ; Literary form: Not fiction Publisher: Materials Park, OH : ASM International, 2006Other title: Proceedings of the 32nd International Symposium for Testing and Failure Analysis \| Conference proceedings from the 32nd International Symposium for Testing and Failure Analysis.Online access: An electronic book accessible through the World Wide Web; click to view Availability: Items available for loan: IUKL Library (1). Place hold Add to cart (remove)
		No cover image available ISTFA 2003 [electronic resource] : proceedings of the 29th International Symposium for Testing and Failure Analysis, 2-6 November 2003, Santa Clara Convention Center, Santa Clara, California / sponsored by EDFAS. by International Symposium for Testing and Failure Analysis (29th : 2003 : Santa Clara, Calif.) \| ASM International \| Electronic Device Failure Analysis Society \| ebrary, Inc. Material type: Book; Format: electronic available online ; Literary form: Not fiction Publisher: Materials Park, Ohio : ASM International, 2003Other title: Proceedings of the 29th International Symposium for Testing and Failure Analysis, 2-6 November 2003 \| Conference proceedings from the 29th International Symposium for Testing and Failure Analysis.Online access: An electronic book accessible through the World Wide Web; click to view Availability: Items available for loan: IUKL Library (1). Place hold Add to cart (remove)
		No cover image available Microwave component mechanics [electronic resource] / Harri Eskelinen, Pekka Eskelinen. by Eskelinen, Harri \| Eskelinen, Pekka \| ebrary, Inc. Material type: Book; Format: electronic available online ; Literary form: Not fiction Publisher: Boston, MA : Artech House, c2003Online access: An electronic book accessible through the World Wide Web; click to view Availability: Items available for loan: IUKL Library (1). Place hold Add to cart (remove)
		No cover image available Microelectronic failure analysis [electronic resource] : desk reference. 2002 supplement / prepared under the direction of the Electronic Device Failure Analysis Society publications committee. by Electronic Device Failure Analysis Society \| ebrary, Inc. Material type: Book; Format: electronic available online ; Literary form: Not fiction Publisher: Materials Park, OH : ASM International, c2002Online access: An electronic book accessible through the World Wide Web; click to view Availability: Items available for loan: IUKL Library (1). Lists: 20220421 MQA FEST Bachelor of Electronics Engineering with Honours . Place hold Add to cart (remove)
		No cover image available ISTFA 2008 [electronic resource] : conference proceedings from the 34th International Symposium for Testing and Failure Analysis, November 2-6, 2008, Oregon Convention Center, Portland, Oregon, USA / sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2008, ASM International. by International Symposium for Testing and Failure Analysis (34th : 2008 : Portland, Or.) \| ASM International \| Electronic Device Failure Analysis Society \| ebrary, Inc. Material type: Book; Format: electronic available online ; Literary form: Not fiction Publisher: Materials Park, OH : Asm International, c2008Other title: Proceedings of the 34th International Symposium for Testing and Failure Analysis \| 34th International Symposium for Testing and Failure Analysis \| Thirty-fourth International Symposium for Testing and Failure Analysis.Online access: An electronic book accessible through the World Wide Web; click to view Availability: Items available for loan: IUKL Library (1). Place hold Add to cart (remove)
		No cover image available ISTFA 2002 [electronic resource] : proceedings of the 28th International Symposium for Testing and Failure Analysis : 3-7 November 2002, Phoenix Civic Center, Phoenix, Ariz. / sponsored by EDFAS, ISTFA. by International Symposium for Testing and Failure Analysis (28th : 2002 : Phoenix, Ariz.) \| ASM International \| Electronic Device Failure Analysis Society \| ebrary, Inc. Material type: Book; Format: electronic available online ; Literary form: Not fiction Publisher: Materials Park, OH : ASM International, 2002Other title: Proceedings of the 28th International Symposium for Testing and Failure Analysis \| Conference proceedings from the 28th International Symposium for Testing and Failure Analysis.Online access: An electronic book accessible through the World Wide Web; click to view Availability: Items available for loan: IUKL Library (1). Place hold Add to cart (remove)
		No cover image available ISTFA 2007 [electronic resource] : proceedings of the 33rd International Symposium for Testing and Failure Analysis, November 4-8, 2007, San Jose McEnery Convention Center, San Jose, California, USA / sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2007, ASM International. by International Symposium for Testing and Failure Analysis (33rd : 2007 : San Jose, Calif.) \| ASM International \| Electronic Device Failure Analysis Society \| ebrary, Inc. Material type: Book; Format: electronic available online ; Literary form: Not fiction Publisher: Materials Park, OH : ASM International, c2007Other title: Proceedings of the 33rd International Symposium for Testing and Failure Analysis \| 33rd International Symposium for Testing and Failure Analysis \| Thirty-third International Symposium for Testing and Failure Analysis.Online access: An electronic book accessible through the World Wide Web; click to view Availability: Items available for loan: IUKL Library (1). Place hold Add to cart (remove)
		No cover image available ISTFA 2000 [electronic resource] : proceedings of the 26th International Symposium for Testing and Failure Analysis, 12-16 November 2000, Meydenbauer Convention Center, Bellevue, Washington. by International Symposium for Testing and Failure Analysis (26th : 2000 : Bellevue, Wash.) \| ASM International \| Electronic Device Failure Analysis Society \| ebrary, Inc. Material type: Book; Format: electronic available online ; Literary form: Not fiction Publisher: Materials Park, OH : ASM International, c2000Other title: Proceedings of the 26th International Symposium or Testing and Failure Analysis \| Conference Proceedings from the 26th International Symposium for Testing and Failure Analysis.Online access: An electronic book accessible through the World Wide Web; click to view Availability: Items available for loan: IUKL Library (1). Place hold Add to cart (remove)
		No cover image available Microelectronic failure analysis [electronic resource] : desk reference : 2001 supplement / prepared under the direction of the Electronic Device Failure Analysis Society Publications Committee. by Electronic Device Failure Analysis Society \| ebrary, Inc. Material type: Book; Format: electronic available online ; Literary form: Not fiction Publisher: Materials Park, OH : ASM International, c2001Online access: An electronic book accessible through the World Wide Web; click to view Availability: Items available for loan: IUKL Library (1). Lists: 20220421 MQA FEST Bachelor of Electronics Engineering with Honours . Place hold Add to cart (remove)

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