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		No cover image available ISTFA 2001 [electronic resource] : proceedings of the 27th International Symposium for Testing and Failure Analysis : 11-15 November 2001, Santa Clara Convention Center, Santa Clara, California / sponsored by EDFAS. by International Symposium for Testing and Failure Analysis (27th : 2001 : Santa Clara, Calif.) \| ASM International \| Electronic Device Failure Analysis Society \| ebrary, Inc. Material type: Book; Format: electronic available online ; Literary form: Not fiction Publisher: Materials Park, OH : ASM International, c2001Other title: Proceedings of the 27th International Symposium or Testing and Failure Analysis \| Conference Proceedings from the 27th International Symposium for Testing and Failure Analysis.Online access: An electronic book accessible through the World Wide Web; click to view Availability: Items available for loan: IUKL Library (1). Place hold Log in to add tags. Add to cart (remove)
		No cover image available ISTFA 2008 [electronic resource] : conference proceedings from the 34th International Symposium for Testing and Failure Analysis, November 2-6, 2008, Oregon Convention Center, Portland, Oregon, USA / sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2008, ASM International. by International Symposium for Testing and Failure Analysis (34th : 2008 : Portland, Or.) \| ASM International \| Electronic Device Failure Analysis Society \| ebrary, Inc. Material type: Book; Format: electronic available online ; Literary form: Not fiction Publisher: Materials Park, OH : Asm International, c2008Other title: Proceedings of the 34th International Symposium for Testing and Failure Analysis \| 34th International Symposium for Testing and Failure Analysis \| Thirty-fourth International Symposium for Testing and Failure Analysis.Online access: An electronic book accessible through the World Wide Web; click to view Availability: Items available for loan: IUKL Library (1). Place hold Add to cart (remove)
		No cover image available ISTFA 2002 [electronic resource] : proceedings of the 28th International Symposium for Testing and Failure Analysis : 3-7 November 2002, Phoenix Civic Center, Phoenix, Ariz. / sponsored by EDFAS, ISTFA. by International Symposium for Testing and Failure Analysis (28th : 2002 : Phoenix, Ariz.) \| ASM International \| Electronic Device Failure Analysis Society \| ebrary, Inc. Material type: Book; Format: electronic available online ; Literary form: Not fiction Publisher: Materials Park, OH : ASM International, 2002Other title: Proceedings of the 28th International Symposium for Testing and Failure Analysis \| Conference proceedings from the 28th International Symposium for Testing and Failure Analysis.Online access: An electronic book accessible through the World Wide Web; click to view Availability: Items available for loan: IUKL Library (1). Place hold Add to cart (remove)
		No cover image available ISTFA 2007 [electronic resource] : proceedings of the 33rd International Symposium for Testing and Failure Analysis, November 4-8, 2007, San Jose McEnery Convention Center, San Jose, California, USA / sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2007, ASM International. by International Symposium for Testing and Failure Analysis (33rd : 2007 : San Jose, Calif.) \| ASM International \| Electronic Device Failure Analysis Society \| ebrary, Inc. Material type: Book; Format: electronic available online ; Literary form: Not fiction Publisher: Materials Park, OH : ASM International, c2007Other title: Proceedings of the 33rd International Symposium for Testing and Failure Analysis \| 33rd International Symposium for Testing and Failure Analysis \| Thirty-third International Symposium for Testing and Failure Analysis.Online access: An electronic book accessible through the World Wide Web; click to view Availability: Items available for loan: IUKL Library (1). Place hold Add to cart (remove)
		No cover image available ISTFA 2000 [electronic resource] : proceedings of the 26th International Symposium for Testing and Failure Analysis, 12-16 November 2000, Meydenbauer Convention Center, Bellevue, Washington. by International Symposium for Testing and Failure Analysis (26th : 2000 : Bellevue, Wash.) \| ASM International \| Electronic Device Failure Analysis Society \| ebrary, Inc. Material type: Book; Format: electronic available online ; Literary form: Not fiction Publisher: Materials Park, OH : ASM International, c2000Other title: Proceedings of the 26th International Symposium or Testing and Failure Analysis \| Conference Proceedings from the 26th International Symposium for Testing and Failure Analysis.Online access: An electronic book accessible through the World Wide Web; click to view Availability: Items available for loan: IUKL Library (1). Place hold Add to cart (remove)
		No cover image available Microelectronic failure analysis [electronic resource] : desk reference : 2001 supplement / prepared under the direction of the Electronic Device Failure Analysis Society Publications Committee. by Electronic Device Failure Analysis Society \| ebrary, Inc. Material type: Book; Format: electronic available online ; Literary form: Not fiction Publisher: Materials Park, OH : ASM International, c2001Online access: An electronic book accessible through the World Wide Web; click to view Availability: Items available for loan: IUKL Library (1). Lists: 20220421 MQA FEST Bachelor of Electronics Engineering with Honours . Place hold Add to cart (remove)
		No cover image available ISTFA 2001 [electronic resource] : proceedings of the 27th International Symposium for Testing and Failure Analysis : 11-15 November 2001, Santa Clara Convention Center, Santa Clara, California / sponsored by EDFAS. by International Symposium for Testing and Failure Analysis (27th : 2001 : Santa Clara, Calif.) \| ASM International \| Electronic Device Failure Analysis Society \| ebrary, Inc. Material type: Book; Format: electronic available online ; Literary form: Not fiction Publisher: Materials Park, OH : ASM International, c2001Other title: Proceedings of the 27th International Symposium or Testing and Failure Analysis \| Conference Proceedings from the 27th International Symposium for Testing and Failure Analysis.Online access: An electronic book accessible through the World Wide Web; click to view Availability: Items available for loan: IUKL Library (1). Place hold Add to cart (remove)
		No cover image available Guide to state-of-the-art electron devices [electronic resource] / edited by Joachim N. Burghartz. by Burghartz, Joachim N \| IEEE Electron Devices Society \| ebrary, Inc. Material type: Book; Format: electronic available online ; Literary form: Not fiction Publisher: Chichester, West Sussex, U.K. : John Wiley & Sons Inc., 2013Online access: An electronic book accessible through the World Wide Web; click to view Availability: Items available for loan: IUKL Library (1). Lists: 20220421 MQA FEST Bachelor of Electronics Engineering with Honours . Place hold Add to cart (remove)
		No cover image available Introduction to microfabrication [electronic resource] / Sami Franssila. by Franssila, Sami \| ebrary, Inc. Edition: 2nd ed.Material type: Book; Format: electronic available online ; Literary form: Not fiction Publisher: Chichester, West Sussex, England ; Hoboken, NJ : John Wiley & Sons, 2010Online access: An electronic book accessible through the World Wide Web; click to view Availability: Items available for loan: IUKL Library (1). Place hold Add to cart (remove)
		No cover image available Electronic devices and circuits [electronic resource] / K. Lal Kishore. by Lal Kishore, K \| ebrary, Inc. Material type: Book; Format: electronic available online ; Literary form: Not fiction Publisher: Hyderabad [India] : BS Publications, 2008Online access: An electronic book accessible through the World Wide Web; click to view Availability: Items available for loan: IUKL Library (1). Place hold Add to cart (remove)
		No cover image available ESD basics [electronic resource] : from semiconductor manufacturing to use / Steven H. Voldman. by Voldman, Steven H \| ebrary, Inc. Material type: Book; Format: electronic available online ; Literary form: Not fiction Publisher: Chichester, West Sussex : Wiley, 2012Online access: An electronic book accessible through the World Wide Web; click to view Availability: Items available for loan: IUKL Library (1). Place hold Add to cart (remove)
		No cover image available Technology for facility managers [electronic resource] : the impact of cutting-edge technology on facility management / IFMA, IFMA Foundation ; Eric Teicholz, IFMA fellow, editor. by Teicholz, Eric \| ebrary, Inc. Material type: Book; Format: electronic available online ; Literary form: Not fiction Publisher: Hoboken, NJ : John Wiley & Sons, Inc., 2012Other title: Impact of cutting-edge technology on facility management.Online access: An electronic book accessible through the World Wide Web; click to view Availability: Items available for loan: IUKL Library (1). Place hold Add to cart (remove)
		No cover image available ISTFA 2009 [electronic resource] : conference proceedings from the 35th International Symposium for Testing and Failure Analysis, November 14-19, 2009, San Jose McEnery Convention Center, San Jose, California, USA / sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2009, ASM International. by International Symposium for Testing and Failure Analysis (35th : 2009 : San Jose, Calif.) \| ASM International \| Electronic Device Failure Analysis Society \| ebrary, Inc. Material type: Book; Format: electronic available online ; Literary form: Not fiction Publisher: Materials Park, Ohio : Asm International, 2009Online access: An electronic book accessible through the World Wide Web; click to view Availability: Items available for loan: IUKL Library (1). Place hold Add to cart (remove)
		Components, packaging and manufacturing technology II : selected, peer reviewed papers from the 2013 3rd International Conference on Packaging and Manufacturing Technology (ICCPMT 2013), December 31, 2013 - January 2, 2014, Brisbane Australia / edited by Andy Wu. by Wu, Andy [editor.]. Material type: Book; Format: available online ; Literary form: Not fiction Publisher: Zurich, Switzerland : TTP, 2014Copyright date: �2014Online access: An electronic book accessible through the World Wide Web; click to view Availability: Items available for loan: IUKL Library (1). Place hold Add to cart (remove)
		Battery power management for portable devices / Yevgen Barsukov, Jinrong Qian. by Barsukov, Yevgen [author.] \| Qian, Jinrong [author.]. Material type: Book; Format: available online ; Literary form: Not fiction Publisher: Boston : Artech House, [2013]Copyright date: �2013Online access: An electronic book accessible through the World Wide Web; click to view Availability: Items available for loan: IUKL Library (1). Place hold Add to cart (remove)
		No cover image available Knowledge-based intelligent information engineering systems and allied technologies [electronic resource] : KES 2002 / edited by E. Damiani ... [et al.]. by International Conference on Knowledge-Based Intelligent Information and Engineering Systems (2002 : University of Milan) \| Damiani, Ernesto \| ebrary, Inc. Material type: Book; Format: electronic available online ; Literary form: Not fiction Publisher: Amsterdam ; Washington, DC : IOS Press/Ohmsha, c2002Online access: An electronic book accessible through the World Wide Web; click to view Availability: Items available for loan: IUKL Library (1). Place hold Add to cart (remove)
		No cover image available Electronic components and processes [electronic resource] / Preeti Maheshwari. by Maheshwari, Preeti \| ebrary, Inc. Material type: Book; Format: electronic available online ; Literary form: Not fiction Publisher: New Delhi : New Age International, c2006Online access: An electronic book accessible through the World Wide Web; click to view Availability: Items available for loan: IUKL Library (1). Place hold Add to cart (remove)
		No cover image available Parts selection and management [electronic resource] / edited by Michael G. Pecht. by Pecht, Michael \| ebrary, Inc. Material type: Book; Format: electronic available online ; Literary form: Not fiction Publisher: Hoboken, N.J. : John Wiley, 2004Online access: An electronic book accessible through the World Wide Web; click to view Availability: Items available for loan: IUKL Library (1). Place hold Add to cart (remove)
		No cover image available Electronic devices and amplifier circuits with MATLAB� / Simulink� / SimElectronics � examples [electronic resource] / Steven T. Karris. by Karris, Steven T \| ebrary, Inc. Edition: 3rd ed.Material type: Book; Format: electronic available online ; Literary form: Not fiction Publisher: [Fremont, CA] : Orchard Publications, c2012Online access: An electronic book accessible through the World Wide Web; click to view Availability: Items available for loan: IUKL Library (1). Place hold Add to cart (remove)
		No cover image available Telecosmos [electronic resource] : the next great telecom revolution / John Edwards. by Edwards, John \| ebrary, Inc. Material type: Book; Format: electronic available online ; Literary form: Not fiction Publisher: Hoboken, N.J. : Wiley-Interscience, c2005Online access: An electronic book accessible through the World Wide Web; click to view Availability: Items available for loan: IUKL Library (1). Place hold Add to cart (remove)

		No cover image available ISTFA 2001 [electronic resource] : proceedings of the 27th International Symposium for Testing and Failure Analysis : 11-15 November 2001, Santa Clara Convention Center, Santa Clara, California / sponsored by EDFAS. by International Symposium for Testing and Failure Analysis (27th : 2001 : Santa Clara, Calif.) \| ASM International \| Electronic Device Failure Analysis Society \| ebrary, Inc. Material type: Book; Format: electronic available online ; Literary form: Not fiction Publisher: Materials Park, OH : ASM International, c2001Other title: Proceedings of the 27th International Symposium or Testing and Failure Analysis \| Conference Proceedings from the 27th International Symposium for Testing and Failure Analysis.Online access: An electronic book accessible through the World Wide Web; click to view Availability: Items available for loan: IUKL Library (1). Place hold Log in to add tags. Add to cart (remove)
		No cover image available ISTFA 2008 [electronic resource] : conference proceedings from the 34th International Symposium for Testing and Failure Analysis, November 2-6, 2008, Oregon Convention Center, Portland, Oregon, USA / sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2008, ASM International. by International Symposium for Testing and Failure Analysis (34th : 2008 : Portland, Or.) \| ASM International \| Electronic Device Failure Analysis Society \| ebrary, Inc. Material type: Book; Format: electronic available online ; Literary form: Not fiction Publisher: Materials Park, OH : Asm International, c2008Other title: Proceedings of the 34th International Symposium for Testing and Failure Analysis \| 34th International Symposium for Testing and Failure Analysis \| Thirty-fourth International Symposium for Testing and Failure Analysis.Online access: An electronic book accessible through the World Wide Web; click to view Availability: Items available for loan: IUKL Library (1). Place hold Add to cart (remove)
		No cover image available ISTFA 2002 [electronic resource] : proceedings of the 28th International Symposium for Testing and Failure Analysis : 3-7 November 2002, Phoenix Civic Center, Phoenix, Ariz. / sponsored by EDFAS, ISTFA. by International Symposium for Testing and Failure Analysis (28th : 2002 : Phoenix, Ariz.) \| ASM International \| Electronic Device Failure Analysis Society \| ebrary, Inc. Material type: Book; Format: electronic available online ; Literary form: Not fiction Publisher: Materials Park, OH : ASM International, 2002Other title: Proceedings of the 28th International Symposium for Testing and Failure Analysis \| Conference proceedings from the 28th International Symposium for Testing and Failure Analysis.Online access: An electronic book accessible through the World Wide Web; click to view Availability: Items available for loan: IUKL Library (1). Place hold Add to cart (remove)
		No cover image available ISTFA 2007 [electronic resource] : proceedings of the 33rd International Symposium for Testing and Failure Analysis, November 4-8, 2007, San Jose McEnery Convention Center, San Jose, California, USA / sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2007, ASM International. by International Symposium for Testing and Failure Analysis (33rd : 2007 : San Jose, Calif.) \| ASM International \| Electronic Device Failure Analysis Society \| ebrary, Inc. Material type: Book; Format: electronic available online ; Literary form: Not fiction Publisher: Materials Park, OH : ASM International, c2007Other title: Proceedings of the 33rd International Symposium for Testing and Failure Analysis \| 33rd International Symposium for Testing and Failure Analysis \| Thirty-third International Symposium for Testing and Failure Analysis.Online access: An electronic book accessible through the World Wide Web; click to view Availability: Items available for loan: IUKL Library (1). Place hold Add to cart (remove)
		No cover image available ISTFA 2000 [electronic resource] : proceedings of the 26th International Symposium for Testing and Failure Analysis, 12-16 November 2000, Meydenbauer Convention Center, Bellevue, Washington. by International Symposium for Testing and Failure Analysis (26th : 2000 : Bellevue, Wash.) \| ASM International \| Electronic Device Failure Analysis Society \| ebrary, Inc. Material type: Book; Format: electronic available online ; Literary form: Not fiction Publisher: Materials Park, OH : ASM International, c2000Other title: Proceedings of the 26th International Symposium or Testing and Failure Analysis \| Conference Proceedings from the 26th International Symposium for Testing and Failure Analysis.Online access: An electronic book accessible through the World Wide Web; click to view Availability: Items available for loan: IUKL Library (1). Place hold Add to cart (remove)
		No cover image available Microelectronic failure analysis [electronic resource] : desk reference : 2001 supplement / prepared under the direction of the Electronic Device Failure Analysis Society Publications Committee. by Electronic Device Failure Analysis Society \| ebrary, Inc. Material type: Book; Format: electronic available online ; Literary form: Not fiction Publisher: Materials Park, OH : ASM International, c2001Online access: An electronic book accessible through the World Wide Web; click to view Availability: Items available for loan: IUKL Library (1). Lists: 20220421 MQA FEST Bachelor of Electronics Engineering with Honours . Place hold Add to cart (remove)
		No cover image available ISTFA 2001 [electronic resource] : proceedings of the 27th International Symposium for Testing and Failure Analysis : 11-15 November 2001, Santa Clara Convention Center, Santa Clara, California / sponsored by EDFAS. by International Symposium for Testing and Failure Analysis (27th : 2001 : Santa Clara, Calif.) \| ASM International \| Electronic Device Failure Analysis Society \| ebrary, Inc. Material type: Book; Format: electronic available online ; Literary form: Not fiction Publisher: Materials Park, OH : ASM International, c2001Other title: Proceedings of the 27th International Symposium or Testing and Failure Analysis \| Conference Proceedings from the 27th International Symposium for Testing and Failure Analysis.Online access: An electronic book accessible through the World Wide Web; click to view Availability: Items available for loan: IUKL Library (1). Place hold Add to cart (remove)
		No cover image available Guide to state-of-the-art electron devices [electronic resource] / edited by Joachim N. Burghartz. by Burghartz, Joachim N \| IEEE Electron Devices Society \| ebrary, Inc. Material type: Book; Format: electronic available online ; Literary form: Not fiction Publisher: Chichester, West Sussex, U.K. : John Wiley & Sons Inc., 2013Online access: An electronic book accessible through the World Wide Web; click to view Availability: Items available for loan: IUKL Library (1). Lists: 20220421 MQA FEST Bachelor of Electronics Engineering with Honours . Place hold Add to cart (remove)
		No cover image available Introduction to microfabrication [electronic resource] / Sami Franssila. by Franssila, Sami \| ebrary, Inc. Edition: 2nd ed.Material type: Book; Format: electronic available online ; Literary form: Not fiction Publisher: Chichester, West Sussex, England ; Hoboken, NJ : John Wiley & Sons, 2010Online access: An electronic book accessible through the World Wide Web; click to view Availability: Items available for loan: IUKL Library (1). Place hold Add to cart (remove)
		No cover image available Electronic devices and circuits [electronic resource] / K. Lal Kishore. by Lal Kishore, K \| ebrary, Inc. Material type: Book; Format: electronic available online ; Literary form: Not fiction Publisher: Hyderabad [India] : BS Publications, 2008Online access: An electronic book accessible through the World Wide Web; click to view Availability: Items available for loan: IUKL Library (1). Place hold Add to cart (remove)
		No cover image available ESD basics [electronic resource] : from semiconductor manufacturing to use / Steven H. Voldman. by Voldman, Steven H \| ebrary, Inc. Material type: Book; Format: electronic available online ; Literary form: Not fiction Publisher: Chichester, West Sussex : Wiley, 2012Online access: An electronic book accessible through the World Wide Web; click to view Availability: Items available for loan: IUKL Library (1). Place hold Add to cart (remove)
		No cover image available Technology for facility managers [electronic resource] : the impact of cutting-edge technology on facility management / IFMA, IFMA Foundation ; Eric Teicholz, IFMA fellow, editor. by Teicholz, Eric \| ebrary, Inc. Material type: Book; Format: electronic available online ; Literary form: Not fiction Publisher: Hoboken, NJ : John Wiley & Sons, Inc., 2012Other title: Impact of cutting-edge technology on facility management.Online access: An electronic book accessible through the World Wide Web; click to view Availability: Items available for loan: IUKL Library (1). Place hold Add to cart (remove)
		No cover image available ISTFA 2009 [electronic resource] : conference proceedings from the 35th International Symposium for Testing and Failure Analysis, November 14-19, 2009, San Jose McEnery Convention Center, San Jose, California, USA / sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2009, ASM International. by International Symposium for Testing and Failure Analysis (35th : 2009 : San Jose, Calif.) \| ASM International \| Electronic Device Failure Analysis Society \| ebrary, Inc. Material type: Book; Format: electronic available online ; Literary form: Not fiction Publisher: Materials Park, Ohio : Asm International, 2009Online access: An electronic book accessible through the World Wide Web; click to view Availability: Items available for loan: IUKL Library (1). Place hold Add to cart (remove)
		Components, packaging and manufacturing technology II : selected, peer reviewed papers from the 2013 3rd International Conference on Packaging and Manufacturing Technology (ICCPMT 2013), December 31, 2013 - January 2, 2014, Brisbane Australia / edited by Andy Wu. by Wu, Andy [editor.]. Material type: Book; Format: available online ; Literary form: Not fiction Publisher: Zurich, Switzerland : TTP, 2014Copyright date: �2014Online access: An electronic book accessible through the World Wide Web; click to view Availability: Items available for loan: IUKL Library (1). Place hold Add to cart (remove)
		Battery power management for portable devices / Yevgen Barsukov, Jinrong Qian. by Barsukov, Yevgen [author.] \| Qian, Jinrong [author.]. Material type: Book; Format: available online ; Literary form: Not fiction Publisher: Boston : Artech House, [2013]Copyright date: �2013Online access: An electronic book accessible through the World Wide Web; click to view Availability: Items available for loan: IUKL Library (1). Place hold Add to cart (remove)
		No cover image available Knowledge-based intelligent information engineering systems and allied technologies [electronic resource] : KES 2002 / edited by E. Damiani ... [et al.]. by International Conference on Knowledge-Based Intelligent Information and Engineering Systems (2002 : University of Milan) \| Damiani, Ernesto \| ebrary, Inc. Material type: Book; Format: electronic available online ; Literary form: Not fiction Publisher: Amsterdam ; Washington, DC : IOS Press/Ohmsha, c2002Online access: An electronic book accessible through the World Wide Web; click to view Availability: Items available for loan: IUKL Library (1). Place hold Add to cart (remove)
		No cover image available Electronic components and processes [electronic resource] / Preeti Maheshwari. by Maheshwari, Preeti \| ebrary, Inc. Material type: Book; Format: electronic available online ; Literary form: Not fiction Publisher: New Delhi : New Age International, c2006Online access: An electronic book accessible through the World Wide Web; click to view Availability: Items available for loan: IUKL Library (1). Place hold Add to cart (remove)
		No cover image available Parts selection and management [electronic resource] / edited by Michael G. Pecht. by Pecht, Michael \| ebrary, Inc. Material type: Book; Format: electronic available online ; Literary form: Not fiction Publisher: Hoboken, N.J. : John Wiley, 2004Online access: An electronic book accessible through the World Wide Web; click to view Availability: Items available for loan: IUKL Library (1). Place hold Add to cart (remove)
		No cover image available Electronic devices and amplifier circuits with MATLAB� / Simulink� / SimElectronics � examples [electronic resource] / Steven T. Karris. by Karris, Steven T \| ebrary, Inc. Edition: 3rd ed.Material type: Book; Format: electronic available online ; Literary form: Not fiction Publisher: [Fremont, CA] : Orchard Publications, c2012Online access: An electronic book accessible through the World Wide Web; click to view Availability: Items available for loan: IUKL Library (1). Place hold Add to cart (remove)
		No cover image available Telecosmos [electronic resource] : the next great telecom revolution / John Edwards. by Edwards, John \| ebrary, Inc. Material type: Book; Format: electronic available online ; Literary form: Not fiction Publisher: Hoboken, N.J. : Wiley-Interscience, c2005Online access: An electronic book accessible through the World Wide Web; click to view Availability: Items available for loan: IUKL Library (1). Place hold Add to cart (remove)

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