IUKL Library

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Wafer-level testing and test during burn-in for integrated circuits [electronic resource] / Sudarshan Bahukudumbi, Krishnendu Chakrabarty.

by Bahukudumbi, Sudarshan | Chakrabarty, Krishnendu | ebrary, Inc.

Material type: book Book; Format: electronic available online remote; Literary form: Not fiction Publisher: Boston : Artech House, 2010Online access: An electronic book accessible through the World Wide Web; click to view Availability: No items available
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Adaptive cooling of integrated circuits using digital microfluidics [electronic resource] / Philip Y. Paik, Krishnendu Chakrabarty, Vamsee K. Pamula.

by Paik, Philip Y | Chakrabarty, Krishnendu | Pamula, Vamsee K. (Vamsee Krishna), 1974- | ebrary, Inc.

Material type: book Book; Format: electronic available online remote; Literary form: Not fiction Publisher: Norwood, Mass. : Artech House, 2007Online access: An electronic book accessible through the World Wide Web; click to view Availability: No items available
Adaptive cooling of integrated circuits using digital microfluidics [electronic resource] / Philip Y. Paik, Krishnendu Chakrabarty, Vamsee K. Pamula.

by Paik, Philip Y | Chakrabarty, Krishnendu | Pamula, Vamsee K. (Vamsee Krishna), 1974- | ebrary, Inc.

Material type: book Book; Format: electronic available online remote; Literary form: Not fiction Publisher: Norwood, Mass. : Artech House, 2007Online access: An electronic book accessible through the World Wide Web; click to view Availability: Items available for loan: IUKL Library (1).
Wafer-level testing and test during burn-in for integrated circuits [electronic resource] / Sudarshan Bahukudumbi, Krishnendu Chakrabarty.

by Bahukudumbi, Sudarshan | Chakrabarty, Krishnendu | ebrary, Inc.

Material type: book Book; Format: electronic available online remote; Literary form: Not fiction Publisher: Boston : Artech House, 2010Online access: An electronic book accessible through the World Wide Web; click to view Availability: Items available for loan: IUKL Library (1).
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