IUKL Library catalog › Results of search for 'su:"Metrology--Congresses."'

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		No cover image available Advanced mathematical & computational tools in metrology & testing VIII [electronic resource] / editors, F. Pavese ... [et al.]. by AMCTM VIII (2008 : Paris, France) \| Pavese, Franco \| ebrary, Inc. Material type: Book; Format: electronic available online ; Literary form: Not fiction Publisher: Singapore ; Hackensack, NJ : World Scientific, c2009Other title: Advanced mathematical and computational tools in metrology and testing VIII \| AMCTM 8.Online access: An electronic book accessible through the World Wide Web; click to view Availability: No items available Log in to add tags. Add to cart (remove)
		No cover image available Advanced mathematical & computational tools in metrology & testing VIII [electronic resource] / editors, F. Pavese ... [et al.]. by AMCTM VIII (2008 : Paris, France) \| Pavese, Franco \| ebrary, Inc. Material type: Book; Format: electronic available online ; Literary form: Not fiction Publisher: Singapore ; Hackensack, NJ : World Scientific, c2009Other title: Advanced mathematical and computational tools in metrology and testing VIII \| AMCTM 8.Online access: An electronic book accessible through the World Wide Web; click to view Availability: Items available for loan: IUKL Library (1). Place hold Add to cart (remove)
		New Frontiers for Metrology. by Milton, M. J. T \| Wiersma, D. S \| Williams, C. J. Edition: 1st ed.Material type: Book; Format: available online ; Literary form: Not fiction Publisher: New York : IOS Press, Incorporated, 2021Copyright date: �2021Online access: Click to View Availability: Items available for loan: (1), IUKL Library (1). Place hold Add to cart (remove)

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