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Advanced mathematical & computational tools in metrology & testing VIII [electronic resource] / editors, F. Pavese ... [et al.].
by AMCTM VIII (2008 : Paris, France) | Pavese, Franco | ebrary, Inc. Material type:  Book; Format:
electronic
available online
 ; Literary form:
Not fiction
Publisher: Singapore ; Hackensack, NJ : World Scientific, c2009Other title: Advanced mathematical and computational tools in metrology and testing VIII | AMCTM 8.Online access: An electronic book accessible through the World Wide Web; click to view Availability: No items available
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Advanced mathematical & computational tools in metrology VI [electronic resource] / editors, P. Ciarlini ... [et al.].
by Ciarlini, P | ebrary, Inc. Material type: Book; Format:
electronic
available online
; Literary form:
Not fiction
Publisher: Singapore ; River Edge, NJ : World Scientific, c2004Online access: An electronic book accessible through the World Wide Web; click to view Availability: No items available
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Advanced mathematical & computational tools in metrology & testing VIII [electronic resource] / editors, F. Pavese ... [et al.].
by AMCTM VIII (2008 : Paris, France) | Pavese, Franco | ebrary, Inc. Material type: Book; Format:
electronic
available online
; Literary form:
Not fiction
Publisher: Singapore ; Hackensack, NJ : World Scientific, c2009Other title: Advanced mathematical and computational tools in metrology and testing VIII | AMCTM 8.Online access: An electronic book accessible through the World Wide Web; click to view Availability: Items available for loan: IUKL Library (1).
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Metrology and physical constants : proceedings of the International School of Physics "Enrico Fermi", course 185, Varenna on Lake Como, Villa Monastero, 17-27 July 2012 / Italian Physical Society ; director of the course A. M. Rossi ; edited by E. Bava and M. K�uhne = Metrologia e costanti fisiche : Rendiconti Della Scuola Internazionale Di Fisica "Enrico Fermi", CLXXXV Corso, Varenna Sul Lago Di Como, Villa Monastero, 17-27 Luglio 2012 / Societ�a Italiana Di Fisica ; direttori del corso A. M. Rossi ; a cura di E. Bava e M. K�uhne.
by Societ�a italiana di fisica | Rossi, A. M | Bava E | K�uhne M. Material type: Book; Format:
available online
; Literary form:
Not fiction
Publisher: Amsterdam, Netherlands : IOS Press, 2013Copyright date: �2013Online access: An electronic book accessible through the World Wide Web; click to view Availability: Items available for loan: IUKL Library (1).
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Production metrology / by Prof. Dr.-Ing. Tilo Pfei, RWTH Aachen.
by Pfeifer, Tilo [author.]. Material type: Book; Format:
available online
; Literary form:
Not fiction
Publisher: M�unchen : Oldenbourg Verlag, [2002]Copyright date: �2002Online access: Click to View Availability: Items available for loan: IUKL Library (1).
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Quantum metrology : foundation of units and measurements. / Ernst O. G�obel and Uwe Siegner.
by G�obel, Ernst O [author.] | Siegner, Uwe [author.]. Material type: Book; Format:
available online
; Literary form:
Not fiction
Publisher: Weinheim, Germany : Wiley-VCH, 2015Copyright date: �2015Online access: Click to View Availability: Items available for loan: IUKL Library (1).
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Handbook of surface and nanometrology [electronic resource] / David J. Whitehouse.
by Whitehouse, D. J. (David J.) | Whitehouse, D. J. (David J.). Handbook of surface metrology | ProQuest (Firm). Edition: 2nd ed.Material type: Book; Format:
electronic
available online
; Literary form:
Not fiction
Publisher: Boca Raton, FL : CRC Press, c2011Online access: Click to View Availability: Items available for loan: IUKL Library (1).
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New Frontiers for Metrology.
by Milton, M. J. T | Wiersma, D. S | Williams, C. J. Edition: 1st ed.Material type: Book; Format:
available online
; Literary form:
Not fiction
Publisher: New York : IOS Press, Incorporated, 2021Copyright date: �2021Online access: Click to View Availability: Items available for loan: (1), IUKL Library (1).
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