000 01339nam a2200349 a 4500
001 ebr5006014
003 CaPaEBR
007 cr cn|||||||||
008 980818s1999 nyu sb 001 0 eng
010 _z 98031039
020 _z0387986332 (alk. paper)
040 _aCaPaEBR
_cCaPaEBR
035 _a(OCoLC)559069862
050 1 4 _aTA169
_b.A95 1999eb
082 0 4 _a620/.00452/015118
_221
100 1 _aAven, T.
_q(Terje)
245 1 0 _aStochastic models in reliability
_h[electronic resource] /
_cTerje Aven, Uwe Jensen.
260 _aNew York :
_bSpringer,
_cc1999.
300 _axii, 270 p.
490 1 _aApplications of mathematics ;
_v41
504 _aIncludes bibliographical references (p. [253]-265) and index.
533 _aElectronic reproduction.
_bPalo Alto, Calif. :
_cebrary,
_d2013.
_nAvailable via World Wide Web.
_nAccess may be limited to ebrary affiliated libraries.
650 0 _aReliability (Engineering)
_xMathematical models.
650 0 _aStochastic processes.
655 7 _aElectronic books.
_2local
700 1 _aJensen, Uwe,
_d1931-
710 2 _aebrary, Inc.
830 0 _aApplications of mathematics ;
_v41.
856 4 0 _uhttp://site.ebrary.com/lib/kliuc/Doc?id=5006014
_zAn electronic book accessible through the World Wide Web; click to view
942 _2lcc
_cEBK
999 _c113035
_d113035