000 01275nam a2200337Ia 4500
001 ebr10688072
003 CaPaEBR
007 cr cn|||||||||
008 081211s2008 njua sb 001 0 eng d
010 _z 2008301306
020 _z9789812797339
020 _z9812797335
020 _z9789812797346
040 _aCaPaEBR
_cCaPaEBR
035 _a(OCoLC)696629586
050 1 4 _aQH212.E4
_bI52 2008eb
082 0 4 _a502.825
_222
245 0 0 _aIn-situ electron microscopy at high resolution
_h[electronic resource] /
_ceditor, Florian Banhart.
260 _aHackensack, NJ :
_bWorld Scientific,
_cc2008.
300 _avi, 311 p. :
_bill. (some col.)
504 _aIncludes bibliographical references and index.
533 _aElectronic reproduction.
_bPalo Alto, Calif. :
_cebrary,
_d2013.
_nAvailable via World Wide Web.
_nAccess may be limited to ebrary affiliated libraries.
650 0 _aElectron microscopy
_xTechnique.
650 0 _aHigh resolution electron microscopy.
655 7 _aElectronic books.
_2local
700 1 _aBanhart, Florian.
710 2 _aebrary, Inc.
856 4 0 _uhttp://site.ebrary.com/lib/kliuc/Doc?id=10688072
_zAn electronic book accessible through the World Wide Web; click to view
942 _2lcc
_cEBK
999 _c119487
_d119487