000 01269nam a22003254a 4500
001 ebr10114034
003 CaPaEBR
007 cr cn|||||||||
008 031015s2004 njua sb 001 0 eng
010 _z 2003063488
020 _z047143308X (cloth)
040 _aCaPaEBR
_cCaPaEBR
035 _a(OCoLC)56354508
050 1 4 _aTK7867.2
_bM66 2004eb
082 0 4 _a621.382/24
_222
100 1 _aMontrose, Mark I.
245 1 0 _aTesting for EMC compliance
_h[electronic resource] :
_bapproaches and techniques /
_cMark I. Montrose, Edward M. Nakauchi.
260 _aHoboken, NJ :
_bJohn Wiley,
_c2004.
300 _axviii, 460 p. :
_bill.
504 _aIncludes bibliographical references (p. 447-451) and index.
533 _aElectronic reproduction.
_bPalo Alto, Calif. :
_cebrary,
_d2013.
_nAvailable via World Wide Web.
_nAccess may be limited to ebrary affiliated libraries.
650 0 _aElectromagnetic compatibility.
650 0 _aElectromagnetic interference.
655 7 _aElectronic books.
_2local
700 1 _aNakauchi, Edward M.
710 2 _aebrary, Inc.
856 4 0 _uhttp://site.ebrary.com/lib/kliuc/Doc?id=10114034
_zAn electronic book accessible through the World Wide Web; click to view
942 _2lcc
_cEBK
999 _c189883
_d189883