| 000 | 02001nam a2200445 i 4500 | ||
|---|---|---|---|
| 001 | ebr10881255 | ||
| 003 | CaPaEBR | ||
| 007 | cr cn||||||||| | ||
| 008 | 140620t20142014gw a ob 001 0 eng d | ||
| 020 | _z9783527411528 | ||
| 020 | _a9783527681082 (e-book) | ||
| 020 | _z9783527681105 (ePub) | ||
| 020 | _z9783527681099 (Mobi) | ||
| 020 | _z9783527681075 (oBook) | ||
| 040 |
_aCaPaEBR _beng _erda _epn _cCaPaEBR |
||
| 035 | _a(OCoLC)881028799 | ||
| 050 | 1 | 4 |
_aQC415 _b.S478 2014eb |
| 082 | 0 | 4 |
_a621.36 _223 |
| 100 | 1 |
_aServ�in, Manuel, _eauthor. |
|
| 245 | 1 | 0 |
_aFringe pattern analysis for optical metrology : _btheory, algorithms, and applications / _cManuel Servin, J. Antonio Quiroga, and J. Moises Padilla. |
| 264 | 1 |
_aWeinheim, Germany : _bWiley-VCH Verlag GmbH & Co. KGaA, _c2014. |
|
| 264 | 4 | _c�2014 | |
| 300 |
_a1 online resource (345 pages) : _billustrations |
||
| 336 |
_atext _2rdacontent |
||
| 337 |
_acomputer _2rdamedia |
||
| 338 |
_aonline resource _2rdacarrier |
||
| 504 | _aIncludes bibliographical references and index. | ||
| 588 | _aDescription based on online resource; title from PDF title page (ebrary, viewed June 19, 2014). | ||
| 590 | _aElectronic reproduction. Palo Alto, Calif. : ebrary, 2015. Available via World Wide Web. Access may be limited to ebrary affiliated libraries. | ||
| 650 | 0 |
_aDiffraction patterns _xData processing. |
|
| 650 | 0 |
_aImage processing _xData processing. |
|
| 655 | 0 | _aElectronic books. | |
| 700 | 1 |
_aQuiroga, J. Antonio, _eauthor. |
|
| 700 | 1 |
_aPadilla, J. Moises, _eauthor. |
|
| 776 | 0 | 8 |
_iPrint version: _aServin, Manuel. _tFringe pattern analysis for optical metrology : theory, algorithms, and applications. _dWeinheim, Germany : Wiley-VCH Verlag GmbH & Co. KGaA, c2014 _hxvi, 327 pages _z9783527411528 |
| 797 | 2 | _aebrary. | |
| 856 | 4 | 0 |
_uhttp://site.ebrary.com/lib/kliuc/Doc?id=10881255 _zAn electronic book accessible through the World Wide Web; click to view |
| 942 |
_2lcc _cEBK |
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| 999 |
_c232829 _d232829 |
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