000 | 04270nam a2200481 i 4500 | ||
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001 | EBC4529314 | ||
003 | MiAaPQ | ||
007 | cr cnu|||||||| | ||
008 | 160211s2016 njua ob 001 0 eng|d | ||
020 |
_z9781119027119 _q(cloth) |
||
020 |
_z111902711X _q(cloth) |
||
020 | _z9781119027140 | ||
020 | _a9781119027126 (e-book) | ||
035 | _a(MiAaPQ)EBC4529314 | ||
035 | _a(Au-PeEL)EBL4529314 | ||
035 | _a(CaPaEBR)ebr11251459 | ||
035 | _a(CaONFJC)MIL924557 | ||
035 | _a(OCoLC)942611368 | ||
040 |
_aMiAaPQ _beng _erda _epn _cMiAaPQ _dMiAaPQ |
||
050 | 4 |
_aTK7871 _b.B748 2016 |
|
082 | 0 |
_a621.381 _223 |
|
100 | 1 |
_aBrillson, L. J., _eauthor. |
|
245 | 1 | 3 |
_aAn essential guide to electronic material surfaces and interfaces / _cLeonard J. Brillson, Ohio State University. |
264 | 1 |
_aHoboken, New Jersey : _bJohn Wiley & Sons, Incorporated, _c2016. |
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300 |
_a1 online resource (379 pages) : _bcolor illustrations |
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336 |
_atext _2rdacontent |
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337 |
_acomputer _2rdamedia |
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338 |
_aonline resource _2rdacarrier |
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504 | _aIncludes bibliographical references and index. | ||
505 | 0 | _aWhy surfaces and interfaces of electronic materials -- Semiconductor electronic and optical properties -- Electrical measurements of surfaces and interfaces -- Localized states at surfaces and interfaces -- Ultrahigh vacuum technology -- Surface and interface analysis -- Surface and interface spectroscopies -- Dynamical depth-dependent analysis and imaging -- Electron beam diffraction and microscopy of atomic-scale geometrical structure -- Scanning probe techniques -- Optical spectroscopies -- Electronic material surfaces -- Surface electronic applications -- Semiconductor heterojunctions -- Metal-semiconductor interfaces -- Next generation surfaces and interfaces. | |
520 |
_a"An Essential Guide to Electronic Material Surfaces and Interfaces is a streamlined yet comprehensive introduction that covers the basic physical properties of electronic materials, the experimental techniques used to measure them, and the theoretical methods used to understand, predict, and design them. Starting with the fundamental electronic properties of semiconductors and electrical measurements of semiconductor interfaces, this text introduces students to the importance of characterizing and controlling macroscopic electrical properties by atomic-scale techniques. The chapters that follow present the full range of surface and interface techniques now being used to characterize electronic, optical, chemical, and structural properties of electronic materials, including semiconductors, insulators, nanostructures, and organics. The essential physics and chemistry underlying each technique is described in sufficient depth for students to master the fundamental principles, with numerous examples to illustrate the strengths and limitations for specific applications. As well as references to the most authoritative sources for broader discussions, the text includes internet links to additional examples, mathematical derivations, tables, and literature references for the advanced student, as well as professionals in these fields. This textbook fills a gap in the existing literature for an entry-level course that provides the physical properties, experimental techniques, and theoretical methods essential for students and professionals to understand and participate in solid-state electronics, physics, and materials science research"-- _cProvided by publisher. |
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588 | _aDescription based on print version record. | ||
590 | _aElectronic reproduction. Ann Arbor, MI : ProQuest, 2016. Available via World Wide Web. Access may be limited to ProQuest affiliated libraries. | ||
650 | 0 |
_aElectronics _xMaterials. |
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650 | 0 |
_aSurfaces (Technology) _xAnalysis. |
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650 | 0 | _aSpectrum analysis. | |
650 | 0 |
_aSemiconductors _xMaterials. |
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655 | 4 | _aElectronic books. | |
776 | 0 | 8 |
_iPrint version: _aBrillson, L. J. _tEssential guide to electronic material surfaces and interfaces. _dHoboken, New Jersey : John Wiley & Sons, Incorporated, 2016 _z9781119027140 |
797 | 2 | _aProQuest (Firm) | |
856 | 4 | 0 |
_uhttp://ebookcentral.proquest.com/lib/kliuc-ebooks/detail.action?docID=4529314 _zClick to View |
942 |
_2lcc _cEBK |
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999 |
_c266467 _d266467 |