000			01555nam a22004094a 4500
001			EBC3035966
003			MiAaPQ
007			cr cn|||||||||
008			010202s2001 maua sb 001 0 eng
010			_z 2001023211
020			_z0792373146 (hardcover : alk. paper)
035			_a(MiAaPQ)EBC3035966
035			_a(Au-PeEL)EBL3035966
035			_a(CaPaEBR)ebr10067374
035			_a(OCoLC)614723684
040			_aMiAaPQ _cMiAaPQ _dMiAaPQ
050		4	_aTK7870.23 _b.S64 2001
082	0	4	_a621.381 _221
100	1		_aSousa, Jos�e T. de.
245	1	0	_aBoundary-scan interconnect diagnosis _h[electronic resource] / _cJos�e T. de Sousa, Peter Y.K. Cheung.
260			_aBoston : _bKluwer Academic Publishers, _cc2001.
300			_axxi, 168 p. : _bill.
490	1		_aFrontiers in electronic testing ; _v18
504			_aIncludes bibliographical references (p. 145-150) and index.
533			_aElectronic reproduction. Ann Arbor, MI : ProQuest, 2015. Available via World Wide Web. Access may be limited to ProQuest affiliated libraries.
650		0	_aBoundary scan testing.
650		0	_aElectronic apparatus and appliances _xTesting.
650		0	_aElectronic packaging.
650		0	_aElectric contacts _xTesting.
655		4	_aElectronic books.
700	1		_aCheung, Peter Y. K.
710	2		_aProQuest (Firm)
830		0	_aFrontiers in electronic testing ; _v18.
856	4	0	_uhttps://ebookcentral.proquest.com/lib/kliuc-ebooks/detail.action?docID=3035966 _zClick to View
942			_2lcc _cEBK
999			_c281610 _d281610