000 | 01385nam a2200361Ia 4500 | ||
---|---|---|---|
001 | ebr10317806 | ||
003 | CaPaEBR | ||
007 | cr cn||||||||| | ||
008 | 090423s2009 enk sb 001 0 eng d | ||
010 | _z 2009015206 | ||
020 | _z9780470511374 (cloth) | ||
040 |
_aCaPaEBR _cCaPaEBR |
||
035 | _a(OCoLC)646814230 | ||
050 | 1 | 4 |
_aTK7871.852 _b.V65 2009eb |
082 | 0 | 4 |
_a621.381 _222 |
100 | 1 | _aVoldman, Steven H. | |
245 | 1 | 0 |
_aESD _h[electronic resource] : _bfailure mechanisms and models / _cSteven H. Voldman. |
246 | 3 | _aElectrostatic discharge | |
260 |
_aChichester, West Sussex, U.K. ; _aHoboken, NJ : _bJ. Wiley, _c2009. |
||
300 | _axxiv, 384 p. | ||
504 | _aIncludes bibliographical references and index. | ||
533 |
_aElectronic reproduction. _bPalo Alto, Calif. : _cebrary, _d2009. _nAvailable via World Wide Web. _nAccess may be limited to ebrary affiliated libraries. |
||
650 | 0 |
_aSemiconductors _xFailures. |
|
650 | 0 |
_aIntegrated circuits _xProtection. |
|
650 | 0 |
_aIntegrated circuits _xTesting. |
|
650 | 0 |
_aIntegrated circuits _xReliability. |
|
650 | 0 | _aElectric discharges. | |
650 | 0 | _aElectrostatics. | |
655 | 7 |
_aElectronic books. _2local |
|
710 | 2 | _aebrary, Inc. | |
856 | 4 | 0 |
_uhttp://site.ebrary.com/lib/kliuc/Doc?id=10317806 _zAn electronic book accessible through the World Wide Web; click to view |
999 |
_c68065 _d68065 |