Terrestrial neutron-induced soft errors in advanced memory devices [electronic resource] /
Takashi Nakamura ... [et al.].
- Hackensack, NJ : World Scientific, c2008.
- xxii, 343 p. : ill. (some col.)
Includes bibliographical references (p. 291-315) and index.
Electronic reproduction.
Palo Alto, Calif. :
ebrary,
2009.
Available via World Wide Web.
Access may be limited to ebrary affiliated libraries.
Semiconductor storage devices.
Neutron irradiation.
Radiation dosimetry.
Nuclear physics.
Electronic books.
TK7895.M4 / T47 2008eb
Includes bibliographical references (p. 291-315) and index.
Electronic reproduction.
Palo Alto, Calif. :
ebrary,
2009.
Available via World Wide Web.
Access may be limited to ebrary affiliated libraries.
Semiconductor storage devices.
Neutron irradiation.
Radiation dosimetry.
Nuclear physics.
Electronic books.
TK7895.M4 / T47 2008eb