Terrestrial neutron-induced soft errors in advanced memory devices [electronic resource] / Takashi Nakamura ... [et al.].
Contributor(s): Nakamura, Takashi | ebrary, Inc.
Material type:
BookPublisher: Hackensack, NJ : World Scientific, c2008Description: xxii, 343 p. : ill. (some col.).Subject(s): Semiconductor storage devices | Neutron irradiation | Radiation dosimetry | Nuclear physicsGenre/Form: Electronic books.Online resources: An electronic book accessible through the World Wide Web; click to view
| Item type | Current location | Collection | Call number | URL | Copy number | Status | Date due | Item holds |
|---|---|---|---|---|---|---|---|---|
E-book
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IUKL Library | Subscripti | http://site.ebrary.com/lib/kliuc/Doc?id=10255560 | 1 | Available |
Total holds: 0
Includes bibliographical references (p. 291-315) and index.
Electronic reproduction. Palo Alto, Calif. : ebrary, 2009. Available via World Wide Web. Access may be limited to ebrary affiliated libraries.
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