ISTFA 2009 conference proceedings from the 35th International Symposium for Testing and Failure Analysis, November 14-19, 2009, San Jose McEnery Convention Center, San Jose, California, USA / [electronic resource] :
sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2009, ASM International.
- Materials Park, Ohio : Asm International, 2009.
- xvi, 355 p. : ill.
Includes bibliographical references and index.
Electronic reproduction.
Palo Alto, Calif. :
ebrary,
2010.
Available via World Wide Web.
Access may be limited to ebrary affiliated libraries.
Electronic apparatus and appliances--Testing--Congresses.
Electronics--Materials--Testing--Congresses.
Electronic books.
TK7871 / .I58 2009eb
Includes bibliographical references and index.
Electronic reproduction.
Palo Alto, Calif. :
ebrary,
2010.
Available via World Wide Web.
Access may be limited to ebrary affiliated libraries.
Electronic apparatus and appliances--Testing--Congresses.
Electronics--Materials--Testing--Congresses.
Electronic books.
TK7871 / .I58 2009eb