ISTFA 2009 [electronic resource] : conference proceedings from the 35th International Symposium for Testing and Failure Analysis, November 14-19, 2009, San Jose McEnery Convention Center, San Jose, California, USA / sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2009, ASM International.
By: (35th : International Symposium for Testing and Failure Analysis (35th : 2009 : San Jose, Calif.).
Contributor(s): ASM International | Electronic Device Failure Analysis Society | ebrary, Inc.
Material type:
BookPublisher: Materials Park, Ohio : Asm International, 2009Description: xvi, 355 p. : ill.Subject(s): Electronic apparatus and appliances -- Testing -- Congresses | Electronics -- Materials -- Testing -- CongressesGenre/Form: Electronic books.Online resources: An electronic book accessible through the World Wide Web; click to view
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Includes bibliographical references and index.
Electronic reproduction. Palo Alto, Calif. : ebrary, 2010. Available via World Wide Web. Access may be limited to ebrary affiliated libraries.
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