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Switching power supply design.
by Pressman, Abraham I. Material type:  Book Publisher: New York : McGraw Hill, 1998Availability: Items available for loan: IUKL Library [Call number: TK7868 Pre] (1).
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Electronic devices and components.
by Seymour, J. Material type: Book Publisher: Essex : Longman, 1988Availability: Items available for loan: IUKL Library [Call number: TK7870 Sey] (1).
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Introduction to electronic devices.
by Shur, Michael. Material type: Book Publisher: New York : John Wiley & Sons, 1995Availability: Items available for loan: IUKL Library [Call number: TK7870 Shu] (1). Items available for reference: IUKL Library [Call number: TK7870 Shu] (1).
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Electronics : project design and management.
by Stadtmiller, D. Joseph. Material type: Book Publisher: New Jersey : Prentice Hall, 2001Availability: Items available for reference: IUKL Library [Call number: TK7836 Sta] (1).
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Electronic project design and fabrication.
by Reis, Ronald A. Edition: 6th.Material type: Book Publisher: New Jersey : Prentice Hall, 2005Availability: Items available for reference: IUKL Library [Call number: TK7870 Rei] (1).
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Electronic devices and circuits [electronic resource] / K. Lal Kishore.
by Lal Kishore, K | ebrary, Inc. Material type: Book; Format:
electronic
available online
 ; Literary form:
Not fiction
Publisher: Hyderabad [India] : BS Publications, 2008Online access: An electronic book accessible through the World Wide Web; click to view Availability: No items available
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ISTFA 2009 [electronic resource] : conference proceedings from the 35th International Symposium for Testing and Failure Analysis, November 14-19, 2009, San Jose McEnery Convention Center, San Jose, California, USA / sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2009, ASM International.
by International Symposium for Testing and Failure Analysis (35th : 2009 : San Jose, Calif.) | ASM International | Electronic Device Failure Analysis Society | ebrary, Inc. Material type: Book; Format:
electronic
available online
; Literary form:
Not fiction
Publisher: Materials Park, Ohio : Asm International, 2009Online access: An electronic book accessible through the World Wide Web; click to view Availability: No items available
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Polymers for electronic components [electronic resource] : a Rapra industry analysis report / by Keith Cousins.
by Cousins, Keith | Rapra Technology Limited | ebrary, Inc. Material type: Book; Format:
electronic
available online
; Literary form:
Not fiction
Publisher: Shrewsbury, U.K. : Rapra Technology, 2001Online access: An electronic book accessible through the World Wide Web; click to view Availability: No items available
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Knowledge-based intelligent information engineering systems and allied technologies [electronic resource] : KES 2002 / edited by E. Damiani ... [et al.].
by International Conference on Knowledge-Based Intelligent Information and Engineering Systems (2002 : University of Milan) | Damiani, Ernesto | ebrary, Inc. Material type: Book; Format:
electronic
available online
; Literary form:
Not fiction
Publisher: Amsterdam ; Washington, DC : IOS Press/Ohmsha, c2002Online access: An electronic book accessible through the World Wide Web; click to view Availability: No items available
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Electronic components and processes [electronic resource] / Preeti Maheshwari.
by Maheshwari, Preeti | ebrary, Inc. Material type: Book; Format:
electronic
available online
; Literary form:
Not fiction
Publisher: New Delhi : New Age International, c2006Online access: An electronic book accessible through the World Wide Web; click to view Availability: No items available
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Electronic materials science [electronic resource] / Eugene A. Irene.
by Irene, Eugene A | ebrary, Inc. Material type: Book; Format:
electronic
available online
; Literary form:
Not fiction
Publisher: Hoboken, N.J. : Wiley-Interscience, c2005Online access: An electronic book accessible through the World Wide Web; click to view Availability: No items available
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Parts selection and management [electronic resource] / edited by Michael G. Pecht.
by Pecht, Michael | ebrary, Inc. Material type: Book; Format:
electronic
available online
; Literary form:
Not fiction
Publisher: Hoboken, N.J. : John Wiley, 2004Online access: An electronic book accessible through the World Wide Web; click to view Availability: No items available
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Telecosmos [electronic resource] : the next great telecom revolution / John Edwards.
by Edwards, John | ebrary, Inc. Material type: Book; Format:
electronic
available online
; Literary form:
Not fiction
Publisher: Hoboken, N.J. : Wiley-Interscience, c2005Online access: An electronic book accessible through the World Wide Web; click to view Availability: No items available
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Radiating non-uniform transmission line systems and the partial element equivalent circuit method [electronic resource] / Jurgen Nitsch, Frank Gronwald and G�unter Wollenberg.
by Nitsch, J�urgen | Gronwald, Frank | Wollenberg, G�unter | ebrary, Inc. Material type: Book; Format:
electronic
available online
; Literary form:
Not fiction
Publisher: Hoboken, NJ : J. Wiley, c2009Online access: An electronic book accessible through the World Wide Web; click to view Availability: No items available
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Boundary-scan interconnect diagnosis [electronic resource] / Jos�e T. de Sousa, Peter Y.K. Cheung.
by Sousa, Jos�e T. de | Cheung, Peter Y. K | ebrary, Inc. Material type: Book; Format:
electronic
available online
; Literary form:
Not fiction
Publisher: Boston : Kluwer Academic Publishers, c2001Online access: An electronic book accessible through the World Wide Web; click to view Availability: No items available
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Electrical characterization of organic electronic materials and devices [electronic resource] / Peter Stallinga.
by Stallinga, Peter, 1966- | ebrary, Inc. Material type: Book; Format:
electronic
available online
; Literary form:
Not fiction
Publisher: Hoboken, NJ : John Wiley & Sons, 2009Online access: An electronic book accessible through the World Wide Web; click to view Availability: No items available
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ISTFA 2005 [electronic resource] : Proceedings of the 31st International Symposium for Testing and Failure Analysis, Movember 6-10, 2005, McEnery Convention Center, San Jose, California / sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2005, ASTM International.
by International Symposium for Testing and Failure Analysis (31st : d2005 : San Jose, Calif.) | ASM International | Electronic Device Failure Analysis Society | ebrary, Inc. Material type: Book; Format:
electronic
available online
; Literary form:
Not fiction
Publisher: Materials Park, OH : ASM International, c2005Online access: An electronic book accessible through the World Wide Web; click to view Availability: No items available
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ISTFA 2004 [electronic resource] : proceedings of the 30th International Symposium for Testing and Failure Analysis, November 14-18, 2004, Worcester's Centrum Centre, Worcester (Boston), Massachusetts / sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2004, ASTM International.
by International Symposium for Testing and Failure Analysis (30th : 2004 : Boston, Mass.) | ASM International | Electronic Device Failure Analysis Society | ebrary, Inc. Material type: Book; Format:
electronic
available online
; Literary form:
Not fiction
Publisher: Materials Park, OH : ASM International, c2004Online access: An electronic book accessible through the World Wide Web; click to view Availability: No items available
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ISTFA 2006 [electronic resource] : proceedings of the 32nd International Symposium for Testing and Failure Analysis, November 12-16, 2006, Renaissance Austin Hotel, Austin, Texas, USA.
by International Symposium for Testing and Failure Analysis (23rd : 2006 : Austin, Tex.) | ASM International | ebrary, Inc. Material type: Book; Format:
electronic
available online
; Literary form:
Not fiction
Publisher: Materials Park, OH : ASM International, 2006Other title: Proceedings of the 32nd International Symposium for Testing and Failure Analysis | Conference proceedings from the 32nd International Symposium for Testing and Failure Analysis.Online access: An electronic book accessible through the World Wide Web; click to view Availability: No items available
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ISTFA 2003 [electronic resource] : proceedings of the 29th International Symposium for Testing and Failure Analysis, 2-6 November 2003, Santa Clara Convention Center, Santa Clara, California / sponsored by EDFAS.
by International Symposium for Testing and Failure Analysis (29th : 2003 : Santa Clara, Calif.) | ASM International | Electronic Device Failure Analysis Society | ebrary, Inc. Material type: Book; Format:
electronic
available online
; Literary form:
Not fiction
Publisher: Materials Park, Ohio : ASM International, 2003Other title: Proceedings of the 29th International Symposium for Testing and Failure Analysis, 2-6 November 2003 | Conference proceedings from the 29th International Symposium for Testing and Failure Analysis.Online access: An electronic book accessible through the World Wide Web; click to view Availability: No items available
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